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雙極性晶體管

二極管

ESD保護(hù)、TVS、濾波和信號(hào)調(diào)節(jié)ESD保護(hù)

MOSFET

氮化鎵場(chǎng)效應(yīng)晶體管(GaN FET)

絕緣柵雙極晶體管(IGBTs)

模擬和邏輯IC

汽車應(yīng)用認(rèn)證產(chǎn)品(AEC-Q100/Q101)

NEVB-NPS1001 load switch evaluation board

The NEVB-NPS1001 is a two-layer PCB containing the NPS1001 load switch device. The VIN and VOUT connections to the device and the PCB layout routing provides a low-resistance pathway into and out of the device under test. Test point connections allow the EVB user to control the device with userdefined test conditions and make accurate RON measurements

Key features & benefits

  • Input voltage can be supplied via the test points J3 (VIN), VIN can range from 0.5 V to 1.8 V.
  • A test load can be connected to terminal J4 (VOUT).
  • Alternatively, there are GND test points at TP4, TP5, TP6, and TP7.
  • Decoupling capacitors are connected to VIN at the input of the EVB and close to the load switch IC. The same holds for the output.
  • The enable pin (EN) and the bias pin (BIAS) both have convenient connections to a pin header and miniature test point, which allows seamless oscilloscope connection while driving the pins with external sources.
  • VIN_Sense (TP2) and VOUT_Sense (TP8) are used when accurate measurements of the input or output are required. Make RON measurements using these Kelvin sense connections when measuring the voltage drop from VIN to VOUT

相關(guān)板塊 (1)

Board Description Type Quick links Shop link
NEVB-NPS1000 load switch evaluation board NEVB-NPS1000-load-switch-evaluation-board NEVB-NPS1000 load switch evaluation board Evaluation board 訂單

相關(guān)板塊 (1)

Board Description Type Quick links Shop link
NEVB-NPS1000 load switch evaluation board NEVB-NPS1000-load-switch-evaluation-board NEVB-NPS1000 load switch evaluation board Evaluation board 訂單

文檔 (1)

文件名稱 標(biāo)題 類型 日期
UM90039 NEVB-NPS1001 load switch evaluation board User manual 2025-04-15